Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale (Hardcover)

Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale By Victor Bellitto (Editor) Cover Image

Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale (Hardcover)

By Victor Bellitto (Editor)

$155.00


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With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Product Details ISBN: 9789535104148
ISBN-10: 9535104144
Publisher: Intechopen
Publication Date: March 23rd, 2012
Pages: 272
Language: English